On Sun, May 31, 2009 at 7:47 PM, Michaela Mücke wrote: > Hi all, > iam Michaela and iam a young Student from Germany (Ulm). > Iam writing my Diploma work about YAFFS2 to integrate in the > real time operation system INTEGRITY-178B from Greenhills. > I have four NAND chips K9K4G08U0M from Samsung, which are > complete one Device. > I think i understand this main working about yaffs2 but iam a little > bit confuse about how to mark bad blocks. Is it a real mark on the There are bad block marks on individual chips. Since you have a device which integrates four NAND chips, there could be extra information on the device, so check the device data sheet. > chip like yaffs1 or is it only a intern thing from yaffs2 ? I have this It's related to the NAND flash, not an invention of Yaffs*. > PackedTags2 with fields SequenceNumber, ObjectID, ChunkID and > byteCount but where is this field for state?? > So what i have to do exactly in this function  markNANDBlockBad? > Real Byte set on the device or only change this variable state of this > block? It should call a MTD layer function, which in turn sets the bad block mark on the NAND flash (or maybe BBT - check the code yourself!). > A other question is, i read YAFFS2 need this Block 0 for intern works. really? I guess this internalStartBlock and StartBlock thing really confuses you and me, maybe someone else here can explain this:) > So what exactly yaffs safe in this block? > Thanks very much !! > > > BR > Michaela > _______________________________________________ > yaffs mailing list > yaffs@lists.aleph1.co.uk > http://lists.aleph1.co.uk/cgi-bin/mailman/listinfo/yaffs > > Rong